電子顯微分析詞匯

1、電鏡詞匯說明：這些詞匯按照各章節(jié)內(nèi)容順序總結(jié)，看詞匯的同時也在把知識點復(fù)習(xí)TEM_ Transmission Electron Microscope透射電子顯微鏡SEM_ Scanning Electron Microscope掃描電子顯微鏡EPMA_ Electron Probe Microanalyzer電子探針顯微分析STEM_ Scanning Transmission Electron Microscope掃描透射電子顯微鏡EDS_ X-ray energy dispersive spectrometerX光能譜分析CBED_ Convergent Beam Electron Dif

2、fraction會聚束電子衍射EELS_ Electron Energy Loss Spectrometry電子能量損失能譜EBSD_ Electron Backscattered Diffraction電子背散射衍射SPM_ Scanning Probe Microscope掃描探針顯微鏡STM_ Scanning Tunneling Microscope掃描隧道顯微鏡AFM_ Atomic Force Microscope原子力顯微鏡HREM_ High Resolution Electron Microscope高分辨電子顯微鏡NBD_ Nano-beam Electron diffra

3、ction納電子衍射resolution分辨率diffraction衍射Rayleigh criterion瑞利判據(jù)accelerating voltage 加速電壓aberration像差spherical aberration球差chromatic aberration色差astigmatism像散distortion畸變short magnetic lens短磁透鏡magnification放大率Polepieces極靴Cs: spherical aberration coefficient球差系數(shù): semi-angle半角tungsten wire鎢絲FEG: Field Emiss

4、ion Gun場發(fā)射槍condenser lens會聚鏡specimen樣品Objective lens物鏡objective aperture物鏡光闌SAD_ selected area diffraction選取衍射SAD aperture選區(qū)光闌Intermediate lens中間鏡Projector lens投影鏡screen光屏diaphragm隔片（光闌外的部分）insert插入pattern圖案，花樣camera chamber照相室CCD_ Charge-Coupled Devices電荷耦合器件IP_ Imaging plate成像板vacuum真空DP_ Diffusio

5、n Pump擴(kuò)散泵side-entry specimen holder側(cè)入樣品桿grid微柵Single-tilt holder單傾臺alignment對中Thin foil薄膜cross section specimen界面樣品prethinning預(yù)減薄dimpler凹坑減薄儀Tripod polisher三角拋光器Twin-jet electropolishing apparatus雙噴電解拋光裝置Ion Milling離子減薄slice薄片Ultramicrotomy超薄切片法Extraction Replication萃取復(fù)型FIB_ Focused Ion Beam聚焦離子束（Ga

6、）inert惰性(in)elastic scattering（非）彈性散射Braggs Law布拉格定律Reciprocal lattice倒易點陣Ewald Sphere愛瓦德球Systematic absence系統(tǒng)消光Relrod倒易桿camera constant相機(jī)常數(shù)Weiss zone law晶帶定律Plot畫出corresponding相關(guān)perpendicular垂直Eucentric plane真實中心平面Displacement位移Index指數(shù)；標(biāo)定integer ratio relationship整數(shù)比關(guān)系radii半徑calculate計算ASTM（America

7、n Society for Testing Material）card美國試驗材料學(xué)會180º ambiguity 180度不確定度dislocation位錯Calibration校正symmetry對稱twinned crystals孿晶twin reflection spots孿生反射點？High Order Laue Zone高階勞埃帶edge邊緣superimpose重疊Tetragonal四方Orthorhombic正交Hexagonal六方Kikuchi Lines菊池線hyperbolae雙曲線Kikuchi pole菊池極Superlattice超點陣Incommen

8、surate structure無公度結(jié)構(gòu)textured specimen織構(gòu)樣品Contrast襯度Kinematical theory運(yùn)動學(xué)理論Dynamical theory動力學(xué)理論Mass-thickness contrast質(zhì)厚襯度Phase contrast image相襯度Z contrast Z襯度absorption吸收Diffraction contrast衍射襯度BF: bright filed image明場像DF: dark filed image暗場像CDF: Centered Dark Field image中心暗場像complementary互補(bǔ)column

9、 approximation柱體近似extinction distance消光距離Thickness fringes等厚條紋Bend Contour彎曲輪廓（等傾條紋）invisibility criterion of defects缺陷不可見判據(jù)Stacking fault層錯Screw dislocation螺位錯Edge dislocation刃位錯real dislocation真實位錯Burgers vectors泊氏矢量Moiré patterns云紋圖案effective extinction distance有效消光距離Characteristic X-ray特征X光

10、SE: secondary electron慢二次電子topographic contrast形貌對比Auger Electron俄歇電子CL: cathodoluminescence陰極熒光Transmitted electrons透射電子（EELS）Scan coils掃描線圈specimen chamber樣品室Cathode Ray Tube陰極射線管Secondary electron yield 二次電子產(chǎn)率trajectory軌跡BSE: Backscattered electron背散射電子Channelling contrast通道襯度orientation取向spatial

11、 distribution of composition成分空間分布Absorption electron image吸收電子像S/N: signal noise ratio信噪比charging充電現(xiàn)象a large depth of focus很大景深Fracture surface斷口表面EBSP:Electron Backscatter Diffraction Pattern 電子背散射衍射圖案Crystal Orientation Mapping晶體取向成像Variable -Pressure SEM可變氣壓掃描電鏡ESEMTM: Environmental SEM環(huán)境掃描電鏡GSE

12、D: gaseous secondary electron detector氣體二次電子探測器Si(Li) detector 鋰漂移硅探測器WDS: Wavelength Dispersive X-ray Spectrometer X射線波譜儀MCA: multichannel analyzer多通道分析儀overlapped peak重疊峰spot analysis點分析Line scan線掃描Element mapping元素分布圖volume exited激發(fā)體積Quantitative analysis定量分析weak-phase-object approximation弱相位物體近似scherzer defocus Scherzer欠焦specimen thickness樣品厚度NED: nano-area electron diffraction微衍射disc盤chemical bonding化學(xué)鍵Energy Filtered Ima