透射電子學(xué)中的一些術(shù)語的翻譯

1、透射電子學(xué)中的一些術(shù)語的翻譯ACF absorption correction factor 吸收校正因子A/D analog to digital (converter)模 擬數(shù)字化ADF annular dark field 環(huán)形暗場AEM analytical electron microscope/microscopy 分析電子顯微鏡/學(xué)AES Auger electron spectrometer/spectroscopy 俄歇電子光譜儀/學(xué)AFF aberration-free focus 無像差焦點(diǎn)ALCHEMI atom location by channeling-enhan

2、ced microanalysis APB anti-phase domain boundary 反相疇界ATW atmospheric thin window BF bright field 明場BFP back focal plane 后焦面BSE backscattered electron 背散射電子BSED backscattered-electron diffraction 背散射電子衍射 BZB Brillouin-zone boundaryC(1,2,etc.)condenser (l, 2, etc.) lens第 1， 2.聚光鏡 CB coherent bremsstra

3、hlungCBED convergent-beam electron diffraction 會聚束電子衍射CBIM convergent-beam imaging 會聚束成像CCD charge-coupled device 電荷耦合裝置CCF cross-correlation function 互相關(guān)函數(shù)CCM charge-collection microscopy CDF centered dark field 中心暗場像CF coherent Fennel/FoucaultCFEG cold field-emission gun 冷場發(fā)射槍CL cathodeluminescenc

4、e 陰極發(fā)光CRT cathode-ray tube 陰極射線管CS crystallographic shear 晶體學(xué)切變CSL coincident-site lattice DF dark field 日音場DOS density of states 態(tài)密度DP diffraction pattern 衍射花樣DQE detection of quantum efficiency 量子探測效率DSTEM dedicated scanning transmission electron microscope 專業(yè)掃 描透射 電子顯 微 鏡 DTSA desktop spectrum an

5、alyzerEBIC electron beam-induced current/conductivity EELS electron energy-loss spectrometry 電子能 量損失譜EFI energy-filtered imaging 能量過濾成像ELNES energy-loss near-edge structure 能量損失近邊結(jié)構(gòu) ELP energy-loss program (Gatan)EMMA electron microscope microanalyzerEMS electron microscopy image simulation 電子顯微學(xué)圖像模

6、擬EPMA electron probe microanalyzerESCA electron spectroscopy for chemical analysis ESI electron spectroscopic imagingEXAFS extended X-ray absorption fine structure擴(kuò)展 X 射線吸收精細(xì)結(jié)構(gòu)EXELFS extended energy-loss fine structure 擴(kuò)展能量損失精細(xì)結(jié)構(gòu)FCF fluorescence correction factor 熒光校正因子FEG field-emission gun 場發(fā)射槍FET

7、 field-effect transistor 場效晶體管FFT fast Fourier transform 快速傅立葉變換FOLZ first-order Laue zone 一階勞埃區(qū)FSE fast secondary electronFTP file transfer protocol 文件傳輸協(xié)議FWHM full width at half maximum半極大處全寬度半峰全寬FWTM full width at tenth maximum GB grain boundary 晶界GCS generalized cross sectionGIF Gatan image filt

8、er Gantan 圖像過濾GOS generalued oscillator strengthHAADF high-angle annular dark field 高角環(huán)形暗場HOLZ higher-order Laue zone 高階勞埃區(qū)HPGe high-purity germanium 高純 GeHRTEM high-resolution transmission electron microscope/microscopy高分辨透射電子顯微鏡 / 學(xué)HV high vacuum 高真空HVEM high voltage electron microscope/microscopy

9、 高壓電子顯微鏡/學(xué)IDB inversion domain boundary 反相疇界IEEE International Electronics and Electrical Engineering IG intrinsic GeIVEM intermediate voltage electron microscope/microscopy 中等電壓電子顯微鏡/學(xué)K-M Kossel-MollenstedtLEED low-energy electron diffraction 低能電子衍射LLS linear least-squares 線性最小二乘LUT look-up table 對

10、照表MC minimum contrast 最小襯度MCA multichannel analyzer 脈沖高度分析儀MDM minimum detectable mass MLS multiple least-squares MMF minimum mass fractionMSDS material safety data sheetsNCEMSS National Center for Electron Microscopy simulation system NIH National Institutes of He althNIST National Institute of Sta

11、ndards and Technology OR orientation relationshipOTEDP oblique-textured electron diffraction pattern PB phase boundary相界P/B peak-to-background ratio 峰背比PEELS parallel electron energy-loss spectrometer/spectroscopy 并聯(lián)電子能量損失譜儀/學(xué)PIMS Precision Ion-Milling System PIPS Precision Ion-Polishing System PM p

12、hotomultiplier 光 電 倍增器POA phase-object approximation 相位物近似QHRTEM quantitative high-resolution transmission electron microsc.定 量高分辨透射電子顯微 學(xué)RB translation boundary (yes, it does!) RCP rocking-beam channeling patterns RDF radial distribut ion functionREM reflection electron microscope/microscopy 反射電子顯微

13、鏡/學(xué)RHEED reflection high-energy electron diffraction 反射高能電子衍射RHF relativistic Hartree-FockRHFS relativistic Hartree-Fock-Slater SAD selected-area diffraction 選區(qū)衍射SE secondary electron 二次電子SEELS serial electron energy-loss spectrometer/spectrometry 串聯(lián)電子能量損失譜儀/學(xué)SEM scanning electron microscope/microsc

14、opy 掃描電子顯微鏡/ 學(xué) SF stacking fault 堆垛層錯SHRLI simulated high-resolution lattice images 程序的名稱SIMS secondary ion mass spectrometry S/N signal-to-noise ratio 信噪比SOLZ second-order Laue zone 二階勞埃區(qū)SRM standard reference materialSTEM scanning transmission electron microscope/microscopy 掃描透射電子顯微鏡/學(xué)STM scanning

15、 tunneling microscope/microscopy 掃描隧道電子顯微鏡/學(xué)TB twin boundary 攣晶界TEM transmission electron microscope/microscopy 透射電子顯微鏡/學(xué)TMBA too many bloody acronyms UHV ultrahigh vacuum 超高真空UTW ultra thin window 超薄窗口V/F voltage to frequency (converter)VLM visible-light microscope/microscopy WB weak beam 弱束WBDF we

16、ak-beam dark field 弱束暗場WDS wavelength-dispersive WP whole pattern 全圖WPOA weak-phase object approximation 弱相位物近似XANES X-ray absorption near-edge structure X 射線吸收近邊結(jié)構(gòu)XEDS X-ray energy-dispersive spectrometer X 射線能量色散譜儀XRD X-ray diffraction X 射線衍射YBCO yttrium-barium-copper oxide 釔鋇銅氧YAG yttrium-aluminu

17、m garnet 釔鋁石榴石ZAF atomic number, absorption, fluorescence correction ZAP zone-axis patternZOLZ zero-order Laue zone 零階勞埃區(qū)ALCHEMI atom location by channeling-enhanced microanalysis 原子位置通道增強(qiáng)微分析ATW atmospheric thin window對應(yīng)于超薄窗，大概是常壓薄窗BZB Brillouin-zone boundary 布里淵區(qū)界CB coherent bremsstrahlung 相干韌致輻射EB

18、IC electron beam-induced current/conductivity 應(yīng)該是電子束誘導(dǎo)電流/ 導(dǎo)電性ELP energy-loss program (Gatan)能量損失程序(Gatan 公司)EMMA electron microscope microanalyzer 電子顯微微分析儀EPMA electron probe microanalyzer 電子探針微分析儀ESCA electron spectroscopy for chemical analysis化學(xué)分析的電子能譜(也就是常見的XPS儀)ESI electron spectroscopic imaging

19、 電子譜成像FSE fast secondary electron 不知道：快速二次電子？FWTM full width at tenth maximum 半高寬吧IEEE International Electronics and Electrical Engineering 著名學(xué)會：國際電子和電氣工程IG intrinsic Ge只知道intrinsic是內(nèi)能K-M Kossel-Mollenstedt會聚束衍射的一種花樣？MDM minimum detectable mass 最小探測量？MMF minimum mass fraction 最小質(zhì)量分?jǐn)?shù)？MSDS material safety data sheets 材料安全數(shù)據(jù)表NCEMSS National Center for Electron Microscopy simulation system 電子顯微學(xué)模擬系統(tǒng)國家 中心NIH National Institutes of Health美國國家健康研究所NIST National Institute of Standards and Technology 美國國家標(biāo)準(zhǔn)和技術(shù)研究所OR orientation relationship 人際導(dǎo)向？猜的OTEDP ob