智能手機(jī)量產(chǎn)通用可靠性測(cè)試標(biāo)準(zhǔn)_圖文

1、德信無(wú)線通訊科技有限公司 TECHFAITH WIRELESS COMMUNICATION TECHNOLOGY LTD. 智能手機(jī)量產(chǎn)通用可靠性測(cè)試標(biāo)準(zhǔn) Smartphone MP General Reliability Test Standard 文件編號(hào) Doc. No. 頁(yè)數(shù) Page ：14 ：QC2039 文件類型 Doc. Type ： 質(zhì)量標(biāo)準(zhǔn) Standards 版本 Version ：1.1 編制者 于洋 田春和 岳清 杜立群 Wu Liang 陳劍波 王小葵 唐亮 參與討論、 評(píng)審人員 SM MR 高滿達(dá) 方漪波 NO 1 變更日期 Change date 2006-5-

2、23 變更理由 Change reason 變更內(nèi)容 Change content 新編 Original 版本 Version 1.0 編制/修改 Create/update 批準(zhǔn) Aproval 2 2006-9-15 optimize 去除參數(shù)測(cè)試， 增加溫度沖擊測(cè)試等 1.1 吳良 高滿達(dá) Doc. Type Standard Doc. No. QC2039 智能手機(jī)量產(chǎn)通用可靠性測(cè)試標(biāo)準(zhǔn) Smartphone MP Generalt Relibility Test Standard Page 1/13 Version 1.1 1、Purpose 目的： To ensure MP pr

3、oduct can meet reliability test requirement and product quality. 為了保證 MP 產(chǎn)品滿足可靠性測(cè)試要求，保證產(chǎn)品質(zhì)量。 2、Scope 范圍 This file is for MP control of smart phone designed by TF. 本標(biāo)準(zhǔn)適用于德信無(wú)線通信集團(tuán)所屬公司研發(fā)的所有智能手機(jī)的量產(chǎn)控制。 3Reference 編制依據(jù)： 產(chǎn)品可靠性測(cè)試標(biāo)準(zhǔn) Product Reliability Test Standard ODM Product EMS Quality Management Flow 4

4、Principle 執(zhí)行原則 . The standard will be added into the quality assurance system of TF. As a part of the handhold product quality assurance system, this should be executed strictly. 該標(biāo)準(zhǔn)被納入德信產(chǎn)品質(zhì)量保證體系，作為手持式移動(dòng)通訊產(chǎn)品質(zhì)量保證的組成部分，要求嚴(yán)格執(zhí) 行并遵守此標(biāo)準(zhǔn)。 5 Judgment 判定標(biāo)準(zhǔn) A 級(jí)：關(guān)鍵缺陷 表現(xiàn)為產(chǎn)品的一項(xiàng)或多項(xiàng)性能指標(biāo)，使用功能失效或外觀受嚴(yán)重影響。具體表現(xiàn) 如產(chǎn)品參數(shù)測(cè)試

5、項(xiàng)單項(xiàng)或多項(xiàng)失敗，單項(xiàng)或多項(xiàng)功能故障，機(jī)械結(jié)構(gòu)，卡扣，導(dǎo)軌，轉(zhuǎn)軸等失效， 殼體破裂等 Level A: Severity defect It means one or more functionality/parameter index items are invalid or degradation seriously, such as RF parameter test items failures, one or more functional failures, mechanism, hook, hinge are invalidation, housing crack etc. B

6、級(jí)：主要缺陷 產(chǎn)品使用功能無(wú)影響，外觀影響較嚴(yán)重。具體表現(xiàn)如產(chǎn)品參數(shù)測(cè)試項(xiàng)單項(xiàng)或多項(xiàng) 性能下降但仍在范圍之內(nèi)，單項(xiàng)或多項(xiàng)功能性能略有下降，機(jī)械結(jié)構(gòu)，卡扣，導(dǎo)軌，轉(zhuǎn)軸等性能下 降但不影響正常使用，噴涂磨損，殼體裂縫等 Level B: General defect The using function has no effect, and the appearance has a terrible effect. Focus on appearance and mechanism failures, but function and parameter test should be ok eve

7、n though degradation occuring. such as performance of functional mechanism， abrasion failure of painting，crack of housing etc. C 級(jí)：次要缺陷 產(chǎn)品使用功能無(wú)影響，外觀影響較輕微，后果嚴(yán)重程度可忽略。具體表現(xiàn)如產(chǎn) 品參數(shù)測(cè)試正常，功能測(cè)試正常，機(jī)械結(jié)構(gòu)，卡扣，導(dǎo)軌，轉(zhuǎn)軸等性能略有下降但不影響正常使用， 噴涂輕微磨損，殼體輕微裂紋等 Level C: Light defect The using function has no effect, and the appea

8、rance has a little effect. Product parameter test and function test are normal, mechanism, hook, hinge are a little weak but still can be used in normal，little abrasion of Doc. Type Standard Doc. No. QC2039 智能手機(jī)量產(chǎn)通用可靠性測(cè)試標(biāo)準(zhǔn) Smartphone MP Generalt Relibility Test Standard Page 3/13 Version 1.1 at room

9、 temperature（2025 C） for 2hours. 將樣機(jī)裝入電池，關(guān)機(jī)，存入 5 個(gè) 電話和 5 條短信息，并將手機(jī)時(shí)鐘 設(shè)置為當(dāng)前日期時(shí)間設(shè)置氣候試 驗(yàn)箱條件為: 60 , 95%RH，將樣 品放入氣候?qū)嶒?yàn)箱持續(xù) 40 小時(shí)， 取出樣品在室溫恢復(fù) 2 小時(shí)后對(duì)樣 破壞性測(cè) 試 Destroy test 濕熱試驗(yàn) Temp/Humidity 品進(jìn)行檢查. Power off the samples with full battery energy and preset five phone numbers and five SMS; setting the current da

10、te and time.Set the chamber temperature: 60 C, 95%RH. Keep samples in the chamber for 40 hours. Take the samples out of the chamber and check them after leave them at room temperature for 2hours 在手機(jī)中預(yù)存入 5 個(gè)電話和 5 條短 信息,并將手機(jī)時(shí)鐘設(shè)置為當(dāng)前日 期時(shí)間. 將手機(jī)設(shè)置為開機(jī)插卡 狀態(tài)。將樣機(jī)放置靜電測(cè)試臺(tái)的絕 緣墊上，并且用充電器加電使手機(jī) 處于充電狀態(tài)（樣機(jī)與絕緣墊邊緣 距離至少

11、2 英寸；兩個(gè)樣機(jī)之間的 距離也是至少 2 英寸） 打開靜電槍， 綜測(cè)儀。將手機(jī)與綜測(cè)儀連接，調(diào) 節(jié)放電方式，分別選擇+/-6kV(接 破壞性測(cè) 試 Destroy test 靜電測(cè)試 ESD 觸放電，+/-13kV（空氣放電） ， 對(duì)手機(jī)指定部位放電 10 次，每測(cè) 試一次，同時(shí)手機(jī)對(duì)地放電一次。 做完一個(gè)部位的測(cè)試，檢查手機(jī)功 能、內(nèi)存、信號(hào)和靈敏度，并觀察 手機(jī)在測(cè)試過(guò)程中有無(wú)死機(jī)，通信 鏈路中斷，LCD 顯示異常，自動(dòng)關(guān) 機(jī)及其他異?，F(xiàn)象。樣機(jī)應(yīng)與綜測(cè) 儀建立起呼叫連接的狀態(tài)下進(jìn)行 各個(gè)放電方式、級(jí)別和極性的測(cè)試 若因軟件故障等無(wú)法建立呼叫時(shí) 可呼 “112” 或拔打 “1860”“1

12、001” / 建立起呼叫。樣機(jī)放電點(diǎn)的定義： /-6KV(接觸放電僅對(duì)于樣機(jī)的 金屬部件、金屬裝飾件、金屬材料 靜電槍，綜 測(cè)儀 ESD generator, 8922 氣候試驗(yàn)箱 Climate chamber 手機(jī)外觀, 結(jié) 構(gòu), 功能, 及 內(nèi)存時(shí)間無(wú)異 常， 所有附件中 參數(shù)指標(biāo)正常， 功能正常。 Appearance, mechanism, function EMS should the and pass memory 按照ODM Product MP Reliability Test Control WI執(zhí)行 Follow ODM Product MP Reliability Te

13、st Control WI muster. All of parameter indexes in the appendixes are in the spec. are Functions normal. 按照ODM Product MP Reliability Test Control WI執(zhí)行 Follow ODM Product MP Reliability Test Control WI 手機(jī)功能, 結(jié) 構(gòu)， 外觀及內(nèi)存 時(shí)間無(wú)異常 Appearance, mechanism, function EMS should muster. and pass memory Doc. Type

14、 Standard Doc. No. QC2039 智能手機(jī)量產(chǎn)通用可靠性測(cè)試標(biāo)準(zhǔn) Smartphone MP Generalt Relibility Test Standard Page 4/13 Version 1.1 或有金屬性能的涂層， Lens 等放電， +/-13kV（空氣放電）對(duì)于樣機(jī)經(jīng) 常被直接接觸到的有縫隙的地方, 如：按鍵，側(cè)鍵，天線，轉(zhuǎn)軸處。 空氣放電前，去除所有的塞子，如 充電器耳機(jī)塞子等。樣機(jī)放置方式： 對(duì)于直握手機(jī)，背面放電時(shí)將 LCD 面向下。 Preset five phone numbers and five SMS; setting the current

15、date and time. Power on the samples with SIM card. Place the horizontal combination plate on the wooden desk and place the insulation sheet on the horizontal combination plate, whose size is smaller by 10 cm in the length and width than the horizontal combination plate, and place the HHP on the dist

16、ance (min. of 10 cm from the edge of the horizontal combination plate. Then confirm that the insulator sheet shows no obvious signs of wear or damage. Switch on static gun and 8922, make a call, then selection the mode of discharge, contact (+/-6kV and air discharge (+/-13kV and then discharge the a

17、im location 10 times and then discharge to ground each time. Check the function, memory, signal and sensitiveness after each test, then observe the samples if their have froze, communication interrupt, LCD display abnormal, power off self-acting or other abnormal statuses. Samples can make a call to

18、 8922 when discharging, if the phone discontact, pls dial 112 or 1860/1001. Contact discharge (+/-6kv is used to all exposed metallized (to make metallic or to coat or treat with metal pieces that a user may touch directly about the ordinary use. Ex Doc. Type Standard Doc. No. QC2039 智能手機(jī)量產(chǎn)通用可靠性測(cè)試標(biāo)準(zhǔn)

19、 Smartphone MP Generalt Relibility Test Standard Page 5/13 Version 1.1 charging terminals, Antenna metal pieces etc. Air discharge is used to all insulation pieces which a user may touch directly about the ordinary use. Ex Key, Side SW, antenna, Gap of the Hinge etc. Remove the covers for the I/O co

20、nnector and H/J before applying air discharge. Straight type: Face the LCD display down when 樣機(jī)外觀，結(jié) 構(gòu)， 功能和內(nèi)存 樣機(jī)中存入 5 個(gè)電話，5 條短信， 并將手機(jī)時(shí)鐘設(shè)置為當(dāng)前時(shí)日期，將 樣機(jī)設(shè)置為開機(jī)不插卡狀態(tài)對(duì)手機(jī) 進(jìn)行 6 個(gè)面 1.0m 的自由跌落實(shí)驗(yàn)， 每個(gè)面的跌落次數(shù)為 2 次，每個(gè)面跌 破壞性測(cè) 試 Destroy test 1.0 米跌落 1.0m drop 落后都要對(duì)手機(jī)進(jìn)行檢查。 Preset five phone numbers and five SMS; setting

21、 the current date and time. Power on the samples without SIM card. Then do the 1.0m-drop test of the 6 face of samples。Each face drop twice. Then check appearances, mechanism, function, EMS memory and time after each drop. 跌落測(cè)試機(jī) Drop tester 符合要求。 所有 附件中參數(shù)指 標(biāo)正常， 功能正 常。 Appearance, mechanism, function

22、 EMS should the and pass memory discharging on the backside. 按照ODM Product MP Reliability Test Control WI執(zhí)行 Follow ODM Product MP Reliability Test Control WI muster. All of parameter indexes in the appendixes are in the spec. are Functions normal. 將手機(jī)裝入電池， 關(guān)機(jī),放入裝滿粉 塵的口袋中連續(xù)晃動(dòng) 1 分鐘,然后 從口袋中取出手機(jī),用無(wú)塵布與離

23、子風(fēng)槍對(duì)其清潔后,進(jìn)行檢查 破壞性測(cè) 試 None destroy test 粉塵試驗(yàn) Dust test The sample should be power off with battery, put the samples into the chamber full of dust and shake for 1minute. Take the samples out of dust tester, use non-dust cloth and ion air gun to clean them, and then check the function mechanical and ap

24、pearance. 沙塵材料: 滑石粉 顆粒大 小:300 目 (約 46m 4 樣品外觀目視 測(cè)試無(wú)異常(顯 示區(qū)域無(wú)明顯 沙塵;殼體表面 噴涂無(wú)褪化現(xiàn) 象手機(jī), 結(jié)構(gòu) 無(wú)異常 注：如果其中有某項(xiàng)測(cè)試 Fail，分析出原因（經(jīng) TF QA 確認(rèn)）后可以進(jìn)行維修后繼續(xù)做下個(gè)步驟的試驗(yàn)， 但測(cè)試過(guò)程必須詳細(xì)的記錄在測(cè)試報(bào)告中。 Remark: If some one during test is fail, it can continue the next test after analyzing root cause (confirmed by TF QA and performing mai

25、ntenance. Doc. Type Standard Doc. No. QC2039 智能手機(jī)量產(chǎn)通用可靠性測(cè)試標(biāo)準(zhǔn) Smartphone MP Generalt Relibility Test Standard Page 11/13 Version 1.1 及專用紙帶（11/16 英寸）測(cè)試方式為 連續(xù)摩擦施加在被測(cè)樣品上的壓力為 175 克，“O”型環(huán)有損壞或使用六個(gè) 月后必須更換特殊形師和設(shè)計(jì)工程師 共同確定。 Fix the sample at the RCA tester and then undergo 150/300 cycles continual abrasion tes

26、t.Make sure the surface of the samples and the axis is upright,(For the surface, fix the front of the housing and make sure it is horizontal and the surface of the testing contact plenary; for bevel and arris, fill up the test part to make sure the “0” ring and rub points connect firmlyCheck the sam

27、ple every 50 cycles and make sure the surface clean.Choose surface, arc, bevel, arris and other parts of samples usually touched during daily life for testing.300 cycles for surface, arc, bevel and 150cycles for arris.During this test, special RCA tester (Type: 7-IBB and special punch tape(11/16 inc

28、h should be used.Test method is continual abrasion.The load bringing to bear the samples is 175g.“O” ring must be changed if it is damaged or has been used for six months.The rub points should be decided by Test engineer and design engineer together for samples in special shapes. 將鉛筆芯削成圓柱形并在 400 目砂

29、紙上磨平后， 裝在鉛筆硬度測(cè)試儀上 （施加在筆尖上的載荷為 500g，鉛 筆與水平面的夾角為 45）在樣品表 非破壞性 測(cè)試 None destroy test 面從不同的方向不同的位置劃出 硬度測(cè)試 Hardness test 35cm 長(zhǎng)的線條 35 條。 對(duì)于噴漆表 面的硬度標(biāo)準(zhǔn)為 2H （三菱牌） 500g 用 的載荷。對(duì)于 Lens 表面的硬度標(biāo)準(zhǔn) 為 3H（三菱牌）用 500g 的載荷。每 劃完一次都應(yīng)將鉛筆磨平。 Make sure the cylindrical pencil lead intact and smoothly by abrading on 鉛筆劃傷 硬度測(cè)試 儀

30、 Pencil hardness test 2 angle(30cm by eye painting. plating, etc, IMD coating For should no peel off and have no signs of of exposure internal layers For print , the pattern or font should have no breakage and illegibility（for print、keypad） 外觀檢查： 用橡 皮擦去鉛筆痕 跡，在日光燈 下，距 30cm 目 視表面噴漆， 印 刷，電鍍，Lens 表面無(wú)劃痕。

31、 Appearance Test: At daylight lamp, observe Doc. Type Standard Doc. No. QC2039 智能手機(jī)量產(chǎn)通用可靠性測(cè)試標(biāo)準(zhǔn) Smartphone MP Generalt Relibility Test Standard Page 12/13 Version 1.1 sand paper. Fix the pencil onto Pencil Scratch Hardness Tester (load is 500g, the angle between pencil and horizontal is 45Scratch 35

32、lines 35 times from different directions on the surface of samples.For painting surface, hardness standard is 2H (Mitsubishi with load of 500g.For Lens surface, hardness standard is 2H (Mitsubishi with load of painting, print and (30cm eye plating by .There should be no scratch on surface erase trac

33、e. mark painted after pencil 500g.Make sure the pencil lead smoothly after each scratch 用劃格器在被測(cè)樣品上劃出 25 個(gè) 1 平方毫米的方格， 劃線應(yīng)深及樣品底 材。切割完后，用柔軟毛刷輕輕刷去 測(cè)試區(qū)域的切落碎片。用 3M610 號(hào) 膠帶牢牢粘住被測(cè)區(qū)域， 并用橡皮用 力檫試膠帶， 以加大膠帶與被測(cè)區(qū)域 接觸面積及力度。1 分鐘后，用手抓 住膠帶一端， 在與被測(cè)樣品垂直的方 向（90）迅速扯下膠帶,并檢查被測(cè) 區(qū)域表面在同一被測(cè)位置重復(fù)粘揭 3 次，每次使用新膠帶。 非破壞性 測(cè)試 None destroy test 附著力測(cè)試 Adhesion test Carve 25 panes with 1mm x 1mm on the painting surface. Carve until the internal layers expose.After scratch, brush the chips of samples by using a soft brush.Stick the 3M610 劃格器 Cross cutting 2 有涂層脫落的 方格數(shù)應(yīng)不大 于總方格數(shù)的 3% 單個(gè)方格涂層 脫落面積不大 于單個(gè)方格總 面積的 50%