文本u9507系列rohs報告wafer report v

1、Test ReportNo.:KA/2015/C2083Date:2015/8/22Page:1of4ADVANCED WIRELESS SEMICONDUCTOR COMPANYNO.6, DA-LI ST RD.,TAINAN SCIENCE-BASED INDUSTRIAL PARK HSIN-SHI.TAINAN CITY ,74145, R.O.CThe following sle(s) was/were submitted and identified by/on behalf of the cnt as :S Sle Descriptionle Receiving Date:砷化

2、鎵晶片2015/8/152015/8/15TO2015/8/22ADVANCED WIRELESS SEMICONDUCTOR COMPANYTesting PeriodSle Submitted By=Test Result(s):Please refer to next page(s).Unless otherwise s ed the results shownhis test report refer only to the sle(s) tested. This test report cannot be reproduced, except in full, without pri

3、or written permisof thejurisdiction i es defined therein. Any holder of thisis advisedt information contained hereon reflects the Companys findings at the time of its ervention only and withhe limitsof C nts instructions, if any. The Companys sole responsibility is to its C nt and thisdoes not exone

4、rate parties to a tranion from exercising all their rights and obligations underthe tranion appearance of thiss. Thiscannot be reproduced except in full, without prior written approval of the Company. Any unauthorized alteration, fery or falsification of the content oris unlawful and offenders may b

5、e prosecuted to the fullest extent of the law.SGS.No. 61, Kai-Fa Road, Nanzih Export Pro sing Zone , Kaohsiung,/高雄市加工出口區(qū)開發(fā)61號臺灣檢驗t + 886 (07)301 2121f + 886 (07)3010867Member of the SGS GroupTest ReportNo.:KA/2014/C2083Date:2014/11/02Page:2of4ADVANCED WIRELESS SEMICONDUCTOR COMPANYNO.6, DA-LI ST RD.

6、,TAINAN SCIENCE-BASED INDUSTRIAL PARK HSIN-SHI.TAINAN CITY ,74145, R.O.CTest Result(s) PART NAME NO.1:SILVER 砷化鎵晶片Note： 1. mg/kg = ppm；0.1wt% = 1000ppmn.d. = Not DetectedMDL = Method Detection LimitUnless otherwise s ed the results shownhis test report refer only to the sle(s) tested. This test repo

7、rt cannot be reproduced, except in full, without prior written permisof thejurisdiction i es defined therein. Any holder of thisis advisedt information contained hereon reflects the Companys findings at the time of its ervention only and withhe limitsof C nts instructions, if any. The Companys sole

8、responsibility is to its C nt and thisdoes not exonerate parties to a tranion from exercising all their rights and obligations underthe tranion appearance of thiss. Thiscannot be reproduced except in full, without prior written approval of the Company. Any unauthorized alteration, fery or falsificat

9、ion of the content oris unlawful and offenders may be prosecuted to the fullest extent of the law.SGS.No. 61, Kai-Fa Road, Nanzih Export Pro sing Zone , Kaohsiung,/高雄市加工出口區(qū)開發(fā)61號臺灣檢驗t + 886 (07)301 2121f + 886 (07)3010867Member of the SGS GroupTest Item (s):UnitMethodMDLResultNo.1HalogenHalogen-Fluor

10、ine (F) (CAS No.: 014762-94-8)mg/kgWith reference to BS EN 14582:2007.ysis was performed by IC.50n.d.Halogen-Chlorine (Cl) (CAS No.: 022537-15-1)mg/kgWith reference to BS EN 14582:2007.ysis was performed by IC.50n.d.Halogen-Bromine (Br) (CAS No.: 010097-32-2)mg/kgWith reference to BS EN 14582:2007.y

11、sis was performed by IC.50n.d.Halogen-Iodine (I)(CAS No.: 014362-44-8)mg/kgWith reference to BS EN 14582:2007.ysis was performed by IC.50n.d.Test ReportNo.:KA/2014/C2083Date:2014/11/02Page:3of4ADVANCED WIRELESS SEMICONDUCTOR COMPANYNO.6, DA-LI ST RD.,TAINAN SCIENCE-BASED INDUSTRIAL PARK HSIN-SHI.TAI

12、NAN CITY ,74145, R.O.Cytical flow chart of halogen content1) Name of thewho made measurement: Jeangin charge of measurement: Ray Chang2)Name of theUnless otherwise s ed the results shownhis test report refer only to the sle(s) tested. This test report cannot be reproduced, except in full, without pr

13、ior written permisof thejurisdiction i es defined therein. Any holder of thisis advisedt information contained hereon reflects the Companys findings at the time of its ervention only and withhe limitsof C nts instructions, if any. The Companys sole responsibility is to its C nt and thisdoes not exon

14、erate parties to a tranion from exercising all their rights and obligations underthe tranion appearance of thiss. Thiscannot be reproduced except in full, without prior written approval of the Company. Any unauthorized alteration, fery or falsification of the content oris unlawful and offenders may

15、be prosecuted to the fullest extent of the law.SGS.No. 61, Kai-Fa Road, Nanzih Export Pro sing Zone , Kaohsiung,/高雄市加工出口區(qū)開發(fā)61號臺灣檢驗t + 886 (07)301 2121f + 886 (07)3010867Member of the SGS Groupysis was performed by ICDilution to fixed volumeOxygen Bomb Combustion /AbsorptionWeighting and putting sle

16、in cellSle pretreatment/separationSlcture and report numberTest ReportNo.:KA/2014/C2083Date:2014/11/02Page:4of4ADVANCED WIRELESS SEMICONDUCTOR COMPANYNO.6, DA-LI ST RD.,TAINAN SCIENCE-BASED INDUSTRIAL PARK HSIN-SHI.TAINAN CITY ,74145, R.O.C* The tested sle / part is marked by an arrow if its shown o

17、n the photo. * End of Report *Unless otherwise s ed the results shownhis test report refer only to the sle(s) tested. This test report cannot be reproduced, except in full, without prior written permisof thejurisdiction i es defined therein. Any holder of thisis advisedt information contained hereon

18、 reflects the Companys findings at the time of its ervention only and withhe limitsof C nts instructions, if any. The Companys sole responsibility is to its C nt and thisdoes not exonerate parties to a tranion from exercising all their rights and obligations underthe tranion appearance of thiss. Thiscannot be reproduced except in full, without prior written approval of the Company. An