開關電源可靠測試規(guī)

ReliabilityTestAmendment1Release可 度測試項目 EvaluationTestItemsTemperature ComponentTemperature Parts 組件Thermal 熱擊穿（失控HighTemperatureShort LifeofElectrolytic 電解電容算出Noise ElectroStatic Lightning InputON/OFFAtHigh LowTemperature DynamicSource FanAbnormalOperation FAN Abnormal HighTemperature LowTemperature Temperature/humidity Strife PLD 常溫、常濕：定義濕溫度５℃～３５℃，相對濕度ReliabilityTestAmendment2ReleaseTemperaturedistributiona.輸入電壓：規(guī)格范圍之最小、最大值。(AC115V/230V→AC90V/265V)b.負載：100%0%、最大,100%)。 待測 負記錄 短路1.4DeratingDeratingDeratingReliabilityTest編Amendment頁3Release1.5Derating 電 電容最高耐溫減Ta LoadSchottyDiodeTj之Ta Load 半導體2.其它半導體（MOSFETInput:85V/265V之礎FR- :CEM- : 基 3.CEM- : 與基板板厚無XPC-FR:判定：PCB絕緣區(qū)分：A Ｅ Ｂ標準溫度： （熱偶 感Abnormal ReliabilityTestAmendment４ReleaseComponenttemperaturerise參考溫度 計算出最大溫升規(guī)格值(i.e.DeratingCurve100%Load100%50℃，6070%之△t.)100%50℃之△t.為規(guī)格值。R-1組件實際溫 過計算得出之△t.ReliabilityTestAmendment５ReleasePartsderating組件度５．滿載關機（不做記錄 待測 負AmendmentReliabilityTest６Release3.4１Surge95﹪２（AC95﹪）Ripple100﹪３ 80﹪95﹪90﹪ 80﹪95﹪90﹪Bridge-Diode80﹪95﹪90﹪90﹪ 80﹪95﹪90﹪90﹪ScottyDiode90﹪95﹪90﹪90﹪ZenerDiode 90﹪90﹪ 80﹪95﹪90﹪４VDSS/VCE95﹪VGSS/VBE95﹪ID/IC95﹪IB95﹪５Surge:65﹪ReliabilityTest編Amendment頁7ReleaseThermalrunaway目的：確認過負載、出力短路下，保護之度b.負載：100%及70%(55℃100﹪，65℃70﹪)。c.周圍溫度：最高動作溫度┼5℃，DeratingCurve100%下溫度上限┼5℃。e.接線圖 恒溫 待測 負電 電4.1.4.4b.c.若有FAN裝置于待測物，需實際仿真安裝于系統(tǒng)之情形進試ReliabilityTestAmendment8ReleaseHightemperatureshotycircuit4.1.5.42記錄溫度上升之情形，參照溫度 過規(guī)定溫度ReliabilityTest編Amendment頁9ReleaseLifeofelectrolyticcapacitor電解電容算出目的：推定待測物之，并確認其可靠度 待測 負T1–L1T2算出之時間應≧規(guī)格所示編AmendmentReliabilityTest頁Release Immuuitye.負載電流：100%f.脈沖規(guī)格：規(guī)格書所列值*110%(50ΩTermination)[如規(guī)格為±2.2KV2.2KV*110%=±2.2KV施加]脈波寬為。100nS,500nS,1000nS，時間g. 待測 電阻負7.4a.依條件施加脈沖于輸入─輸入間，輸入─Ground制回路、異常振蕩等)保護回路誤動作及組件損壞發(fā)生，測試時，輸出電壓之安定度應在總和變動規(guī)格范圍內(nèi)。ReliabilityTestAmendmentReleaseElectrostaticdischargeX110%[ChargeCapacitor500pF-SeriesResistor100Ω]，時間≧10sec. 待測 電阻負示波 4.1.8.4ReliabilityTestAmendmentReleaseLightningSurgeLightningSurge施加波形：JEC2121.2μs,50μs4.1.9.4a.Surge輸入─輸入，輸入─Ground3確認組件無破損，無絕緣破壞，F(xiàn)lashoverArcReliabilityTestAmendmentReleaseInputON/OFFathightemperatureON/OFFON/OFFb.100%LOADc.4.1.10.4a.12ON/OFF500cycle能正常（ON5S，OFF30S）。ReliabilityTest編Amendment頁ReleaseLowtemperatureoperation目的：為確保待測產(chǎn)品可靠度，確認周圍溫度下限之動作度11.4Reliability編AmendmentV頁ReleaseDynamicsourceeffectb.100%。d.← 額定電 ←最小電 待測 負12.4VS。VH–VS x100% VL–VS x100% ReliabilityTest編Amendment頁ReleaseFanabnormaloperationFANb.負載：最大100%。c.周圍溫度：感熱組件部份，依動作可能溫度范圍上限＋5℃，25℃及下限－5℃共3＋5℃，實施量測。d. 待測 負13.4主要晶體管、變壓器、CHOKEFanOpenFrame確定在測試條件下，無保護回路之誤動作發(fā)生，組件上升溫度過規(guī)格值ReliabilityTestAmendmentReleaseVibration動作狀態(tài)：Non-振動頻率：5~10Hz全振 1010~200Hz加速度21.6m/sec2SweepTime:10Min振動方向：X,Y,Z1y 4.1.14.4依測試條件或產(chǎn)品規(guī)格所列條件進試ReliabilityTestAmendmentReleaseShock沖擊加速度沖擊時間：11±5msec振動方向：X(X’),Y(Y’),Z,53e.NonOperating依測試條件進試1.Y Z’ c.588m/sec2(60G)3d.AmendmentReliabilityTestReleaseAbnormalRippleRipple負載：0%~100%周圍溫度：動作溫度范圍(i.e.–20℃~60℃→－20℃/25℃/60℃)e. 待測 負4.1.16.41 Ripple導致之微小異常振蕩。ReliabilityTestAmendmentReleaseHighTemperatureTest(degC)functional 1 TimeTH:產(chǎn)品規(guī)格所列之溫度上 載：100%LOAD。17.4產(chǎn)品置于恒溫槽內(nèi)，依上述之條件進試ReliabilityTestAmendmentReleaseLowTemperatureTest(degC)- functionalTime 負載：100%LOAD。e.TL：規(guī)格所列之溫度下限f.18.4產(chǎn)品置于恒溫槽內(nèi)，依上述之溫度設定及接線圖進試ReliabilityTest編Amendment頁ReleaseTemperature/HumidityTestTemp FunctiontestPoweron 72 788082 負載：100%LOAD Timee.4.1.19.4依上所列之測試條件及接線方式，執(zhí)試ReliabilityTestAmendmentReleaseStrifeTeste.100%LOAD。20.4產(chǎn)品若功能正常，將溫度每次升高10℃，進試，至產(chǎn)品失效為止，記錄失效ReliabilityTestAmendmentReleasePLDtest(Anundervoltageof25%belowtheminimumvoltage,appliedfortwoseconds,repeated10times errorfreewitha10%dutycycle.Anundervoltageof35%belowtheminimuminputvoltage,butnotlessthan68V,appliedfor30 cyclesoftheinputfrequency,repeated10timeswitha10%dutyAnundervoltageof100%belowtheminimumnominalvoltage,appliedfor20milli-secondsrepeated10times errorfreewitha10%dutycycle.Anovervoltageof20%abovetheumnominalvoltageappliedfortwoseconds,repeated10timeswith errorfreea10%dutycycle.Wheneitherofthefollowingwaveformsareappliedtoeitherpolaritypeakoftheinputvoltagewaveform.Thewaveformsshallconsistof400HZ±50HZor800HZ±100HZexponentiallydecayingsinusoidwithapeakvoltageequaltothepeaknominallinevoltage errorfreeanddecaytimeconstantsuchthatthefifthhalf-cycleofthedisturbanceisbetween15and25%ofthehalf-cycle.Thetotaldurationoftheshallnotexceedonecycleofthelinevoltage.Thistestshallberepeated320times(80positiveringsand80negativeringsat400HZ;80positiveringsand80negativeringsat800HZ)athree(3)secondF.Differentialmode(line-to-line)andcommon(line-to-ground)voltagesurgeswithopencircuitvoltagesof2.5KVpeak±10%and2KVpeak±10%respectively.Thesourceimpedanceofthesurgegeneratorshallbe: errorfree2ohm±20%.ThesurgewaveshallbedefinedinANSI/IEEEC62.41(1980)andIEC60-2(1973).threepositiveandthreenegativesurgesshallbeappliedat0,90,180,and270degrees(24total).Thetimeintervalbetweensurgesshallbe18seconds.ReliabilityTestAmendmentReleaseA100nanosecondpulsewithanamplitudeofvoltsshallbesuperimposedonthepeakofthe errorfreenominalinputvoltageandrepeatedatthelinefrequencyforten(10)ThepowersupplyshallsuffernophysicaldamageunderthefollowingdisurbancesinAClinevoltage.Repeateachtestfivetimes,returningthepowersupply:damagefreetoitsnormalrunningconditionsbetweentests.AcompletelineoutageforanyThepowersupplyshallsuffernophysicaldamage