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集成電路工藝和版圖設(shè)計
概述
JianFang
ICDesignCenter,UESTC8/6/20241JianFang微電子制造工藝8/6/20242JianFangIC常用術(shù)語園片:硅片芯片(Chip,Die):6
、8:硅(園)片直徑:1
=25.4mm6150mm;8200mm;12300mm;亞微米<1m的設(shè)計規(guī)范深亞微米<=0.5m的設(shè)計規(guī)范0.5m、0.35m-設(shè)計規(guī)范(最小特征尺寸)布線層數(shù):金屬(摻雜多晶硅)連線的層數(shù)。集成度:每個芯片上集成的晶體管數(shù)8/6/20243JianFangIC工藝常用術(shù)語凈化級別:Class1,Class10,Class10,000每立方米空氣中含灰塵的個數(shù)去離子水氧化擴(kuò)散注入光刻…………….8/6/20244JianFang生產(chǎn)工廠簡介PSI8/6/20245JianFangFabTwowascompletedJanuary2,2019andisa"StateoftheArt"facility.This2,200squarefootfacilitywasconstructedusingallthelatestmaterialsandtechnologies.Inthissetofcleanroomswechangetheair390timesperhour,
ifyoudothemathwithULPAfiltrationthisisaClassOnefacility.WehavehadittestedanditdoesmeetClassOneparameters(withoutanypeopleworkinginit).Sincewearenotmakingmicroprocessorshereandwedon'twanttowear"spacesuits",werunitasaclass10fab.EventhoughitconsistentlyrunswellbelowClassTen.8/6/20246JianFangHereintheFabTwo
Photolithographyareaweseeoneofour200mm.35micronI-LineSteppers.thissteppercanimageandalignboth6&8inchwafers.8/6/20247JianFangAnotherviewofoneoftheFabTwoPhotolithographyareas.8/6/20248JianFangHereweseeatechnicianloading300mmwafersintotheSemiTool.Thewafersareina13waferTefloncassetteco-designedbyProcessSpecialtiesandSemiToolin2019.Againthesearetheworld'sfirst300mmwetprocesscassettes(thatcanbespinrinsedried).8/6/20249JianFangAswelookinthiswindowweseetheWorld'sFirsttrue300mmproductionfurnace.Ourdevelopmentanddesignofthistoolbeganin1992,itwasinstalledinDecemberof2019andbecamefullyoperationalinJanuaryof2019.8/6/202410JianFangHerewecanseetheloadingof300mmwafersontothePaddle.8/6/202411JianFangProcessSpecialtieshasdevelopedtheworld'sfirstproduction300mmNitridesystem!Webeganprocessing300mmLPCVDSiliconNitrideinMayof2019.8/6/202412JianFang2,500additionalsquarefeetof"StateoftheArt"ClassOneCleanroomiscurrentlyprocessingwafers!Withincreased300mm&200mmprocessingcapabilitiesincludingmorePVDMetalization,300mmWetprocessing/Cleaningcapabilitiesandfullwafer300mm.35umPhotolithography,allinaClassOneenviroment.8/6/202413JianFangCurrentlyourPS300AandPS300Bdiffusiontoolsarecapableofrunningboth200mm&300mmwafers.Wecanevenprocessthetwosizesinthesamefurnaceloadwithoutsufferinganyuniformityproblems!(ThermalOxideOnly)8/6/202414JianFangAccuracyinmetrologyisneveranissueatProcessSpecialties.Weusethemostadvancedroboticlaserellipsometersandothercalibratedtoolsforprecisionthinfilm,resistivity,CDandstepheightmeasurement.IncludingournewNanometrics8300fullwafer300mmthinfilmmeasurementandmappingtool.WealsouseoutsidelaboratoriesandourexcellentworkingrelationshipswithourMetrologytoolcustomers,foradditionalcorrelationandcalibration.8/6/202415JianFangOneoftwoSEMLabslocatedinourfacility.InthisoneweareusingafieldemissiontoolforeverythingfromlookingatphotoresistprofilesandmeasuringCD'stodoublecheckingmetaldepositionthicknesses.Atthehelm,anotheroneofourprocessengineersyoumayhavespokenwithMarkHinkle.8/6/202416JianFangHerewearelookingattheIncomingmaterialdispositionracks
8/6/202417JianFangAboveyouarelookingatacoupleofviewsofthefacilitiesonthewestsideofFabOne.Hereyoucanseeoneofour18.5Meg/OhmDIwatersystemsandoneoffour
10,000CFMairsystemsfeedingthisfab(leftpicture),aswellasoneofourwaste
airscrubberunits(rightpicture).Bothareinsidethebuildingforeasiermaintenance,longerlifeandbettercontrol.8/6/202418JianFang集成電路(IntegratedCircuit,IC):半導(dǎo)體IC,膜IC,混合IC半導(dǎo)體IC:指用半導(dǎo)體工藝把電路中的有源器件、無源元件及互聯(lián)布線等以相互不可分離的狀態(tài)制作在半導(dǎo)體上,最后封裝在一個管殼內(nèi),構(gòu)成一個完整的、具有特定功能的電路。半導(dǎo)體IC雙極ICMOSICBiCMOSPMOSICCMOSICNMOSIC8/6/202419JianFangMOSIC及工藝MOSFET—MetalOxideSemiconductorFieldEffectTransistor.—金屬氧化物半導(dǎo)體場效應(yīng)晶體管Si金屬氧化物(絕緣層、SiO2)半導(dǎo)體MOS(MIS)結(jié)構(gòu)8/6/202420JianFangP-襯底n+n+漏源柵柵氧化層氧化層溝道GDSVTVGSIDVDS>0反型層溝道源(Source)S漏(Drain)D柵(Gate)G柵氧化層厚度:50埃-1000埃(5nm-100nm)VT-閾值電壓電壓控制N溝MOS(NMOS)
P型襯底,受主雜質(zhì);柵上加正電壓,表面吸引電子,反型,電子通道;漏加正電壓,電子從源區(qū)經(jīng)N溝道到達(dá)漏區(qū),器件開通。8/6/202421JianFangN-襯底p+p+漏源柵柵氧化層場氧化層溝道P溝MOS(PMOS)GDSVTVGSID+-VDS<0
N型襯底,施主雜質(zhì),電子導(dǎo)電;柵上加負(fù)電壓,表面吸引空穴,反型,空穴通道;漏加負(fù)電壓,空穴從源區(qū)經(jīng)P溝道到達(dá)漏區(qū),器件開通。8/6/202422JianFangCMOS
CMOS:ComplementarySymmetryMetalOxideSemiconductor
互補(bǔ)對稱金屬氧化物半導(dǎo)體-特點(diǎn):低功耗VSSVDDVoViCMOS倒相器PMOSNMOSI/OI/OVDDVSSCCCMOS傳輸門8/6/202423JianFangN-SiP+P+n+n+P-阱DDVoVGVSSSSVDDCMOS倒相器截面圖CMOS倒相器版圖8/6/202424JianFangpwellactivepolyN+implantP+implantomicontactmetalANMOSExample8/6/202425JianFangpwellPwellActivePolyN+implantP+implantOmicontactMetal8/6/202426JianFangN-typeSiSiO2光刻膠光MASKPwell8/6/202427JianFangN-typeSiSiO2光刻膠光刻膠MASKPwell8/6/202428JianFangN-typeSiSiO2光刻膠光刻膠SiO28/6/202429JianFangN-typeSiSiO2SiO2Pwell8/6/202430JianFangpwellactivePwellActivePolyN+implantP+implantOmicontactMetal8/6/202431JianFangN-typeSiSiO2PwellSiO2光刻膠MASKactiveMASKActiveSi3N48/6/202432JianFangN-typeSiSiO2PwellSiO2光刻膠光刻膠MASKactiveMASKActiveSi3N48/6/202433JianFangN-typeSiSiO2PwellSiO2光刻膠光刻膠Si3N48/6/202434JianFangN-typeSiSiO2PwellSiO2場氧場氧場氧PwellSi3N48/6/202435JianFangN-typeSiSiO2Pwell場氧場氧場氧Pwell8/6/202436JianFangN-typeSiSiO2PwellSiO2場氧場氧場氧Pwellpoly8/6/202437JianFangactivepwellpolyPwellActivePolyN+implantP+implantOmicontactMetal8/6/202438JianFangN-typeSiSiO2PwellSiO2MASKpoly場氧場氧場氧Pwellpoly光刻膠8/6/202439JianFangN-typeSiSiO2PwellSiO2MASKpoly場氧場氧場氧Pwell光刻膠poly8/6/202440JianFangN-typeSiSiO2PwellSiO2場氧場氧場氧Pwellpoly8/6/202441JianFangN-typeSiSiO2PwellSiO2場氧場氧場氧Pwellpoly8/6/202442JianFangactivepwellpolyN+implantPwellActivePolyN+implantP+implantOmicontactMetal8/6/202443JianFangN-typeSiSiO2PwellSiO2MASKN+場氧場氧場氧Pwellpoly光刻膠8/6/202444JianFangN-typeSiSiO2PwellSiO2場氧場氧場氧Pwell光刻膠polyN+implantS/D8/6/202445JianFangactivepwellpolyP+implantPwellActivePolyN+implantP+implantOmicontactMetal8/6/202446JianFangN-typeSiSiO2PwellSiO2MASKN+場氧場氧場氧Pwellpoly光刻膠光S/D8/6/202447JianFangN-typeSiSiO2PwellSiO2場氧場氧場氧PwellS/Dpoly光刻膠P+implantP+接觸8/6/202448JianFangN-typeSiSiO2PwellSiO2場氧場氧場氧PwellpolyS/DP+接觸8/6/202449JianFangactivepwellpolyP+implantN+implantomicontactPwellActivePolyN+implantP+implantOmicontactMetal8/6/202450JianFangN-typeSiSiO2PwellSiO2MASKOmicontact場氧場氧場氧PwellpolyS/DP+接觸8/6/202451JianFangactivepwellpolyN+implantomicontactmetalPwellActivePolyN+implantP+implantOmicontactMetal8/6/202452JianFangN-typeSiSiO2PwellSiO2MASKmetal場氧場氧場氧PwellpolyS/DP+接觸metalmetalmetal8/6/202453JianFangpwellactivepolyN+implantP+implantomicontactmetal8/6/202454JianFang雙極型IC及工藝NPN基極集電極發(fā)射極PNP基極集電極發(fā)射極CBEIBICIECBEIBICIENPN晶體管PNP晶體管8/6/202455JianFangVCEiCiBVCE(sat)iR雙極型晶體管輸出特性放大區(qū)飽和區(qū)電流放大能力;電流驅(qū)動;8/6/202456JianFang基極發(fā)射極N+N-PN+集電極基極發(fā)射極P+NNPEBBCCN+CCBBEPP+P+PN+N8/6/202457JianFang
BiCMOS:雙極(Bipolar)與CMOS相容技術(shù)。
BiCMOS可以將雙極器件與CMOS器件制作在同一芯片上,使之具有雙極電路的高速度、高驅(qū)動能力、高模擬精度,又具有CMOS電路的低功耗、高集成度等特性。
BiCMOS工藝較之CMOS工藝和雙極工藝都復(fù)雜,制作周期長,產(chǎn)品成品率比CMOS低,成本比CMOS高。高性能雙極工藝與CMOS的VLSI工藝80%的工藝是相同的,在CMOS生產(chǎn)線上,只要改動或增添一部分工序,增添一部分設(shè)備,就可以制作BiCMOS芯片。BiCMOS8/6/202458JianFang版圖設(shè)計(layout)及相關(guān)技術(shù)8/6/202459JianFangCelldevelopment(Analog/digital)
AnalogdesignSchematicentry(transistorsymbols)Analogsimulation(SPICEmodels)Layout(layerdefinitions)DesignRuleChecking,DRC(designrules)Extraction(extractionrulesandparameters)ElectricalRuleChecking,ERC(ERCrules)LayoutVersusSchematic,LVS(LVSrules)8/6/202460JianFangLayoutDrawinggeometricalshapes: Defineslayouthierarchy
DefineslayermasksRequiresdetailedknowledgeaboutCMOStechnologyRequiresdetailedknowledgeaboutdesignrules(hundredsofrules)RequiresdetailedknowledgeaboutcircuitdesignSlowandtediousOptimumperformancecanbeobtained8/6/202461JianFang圖形層的定義N+implantmetalpwellactivePoly定義若干圖層,每層對應(yīng)一張掩膜版pwellactivepolyN+implantP+implantomicontactmetal8/6/202462JianFangLibALibBLibCCell1Cell2Cell3Tech
inst1inst2Inst3版圖庫的組織一個庫對應(yīng)一個特定的工藝針對該工藝的設(shè)計規(guī)則,和環(huán)境設(shè)定放在Tech文件中.
一個庫可以包含若干不同層次的Cell.8/6/202463JianFang版圖數(shù)據(jù)交換文件
GDSII格式
CIF格式
EDIF格式基本圖形基本操作8/6/202464JianFangDRCDesignRuleCheckChecksgeometricalshapes: width,length,spacing,overlap,etc.
1.單層規(guī)則該規(guī)則包括各層的最小寬度a及同層間距b
層名稱寬度a間距b層名稱寬度a間距bn+保護(hù)環(huán)510p+注入?yún)^(qū)105有源區(qū)1010多晶硅布線88p+保護(hù)環(huán)510多晶硅柵68歐姆孔814布線鋁條1010p阱11014電源、地線鋁條2510n+注入?yún)^(qū)105p+墻58/6/202465JianFang
CMOS電路規(guī)則2.層間規(guī)則(包括各層間的間距、包圍、迭搭的大?。?/6/202466JianFang說明標(biāo)號尺寸(um)有源區(qū)包圍歐姆孔a4金屬(鋁)包圍歐姆孔b3多晶硅包圍歐姆孔c4n+、p+注入?yún)^(qū)包圍有源區(qū)d5n+、p+保護(hù)環(huán)~有源區(qū)e10n+、p+保護(hù)環(huán)寬度f5nmos、pmos多晶硅柵寬度g6多晶硅柵伸出有源區(qū)h12多晶硅柵與n+、p+保護(hù)環(huán)迭搭i2多晶硅柵~鋁布線j1p阱包圍p+保護(hù)環(huán)k2…………..8/6/202467JianFangDRC文件例子(片斷) (drcmetal (width<1.00) ) (drcmetal (sep<0.80) ) (drcmetalomicont (enc<0.30) ) (drcpolyomicont (enc<0.40) )
8/6/202468JianFangEXTRACT用圖層間的相對關(guān)系判定器件及相互連接關(guān)系.例如:Poly跨過Active,即同時出現(xiàn)Poly和Active表明有一個MOS器件.
Extractselectricalcircuit:
transistors,connections,capacitance,resistanceINOutVddGnd8/6/202469JianFangEXTRACT文件例子(片斷)(extractDevicengate(poly"G")(nsd"S""D")(pwell1"B")"nmos4symbolanalogLib")(extractDevicepgate(poly"G")(psd"S""D")(sub"B")"pmos4symbolanalogLib")
pgateWidth=measureParameter(length(pgatecoincidentpoly)0.5) pgateLength=measureParameter(length(pgateinsidepoly)0.5) saveParameter(pgateWidth"W") saveParameter(pgateLength"L")
ngateWidth=measureParameter(length(ngatecoincidentpoly)0.5) ngateLength=measureParameter(length(ngateinsidepoly)0.5) saveParameter(ngateWidth"W") saveParameter(ngateLength"L")8/6/202470JianFangLVS10101010101040EXTLVSLayoutversusschematic
transistors:
parallelorserialCompareselectricalcircuits:
(schematicandextractedlayout)8/6/202471JianFangERCElectricalrulecheckCheckselectricalcircuit:unconnectedinputs
shortedoutputs
correctpowerandgroundconnection8/6/202472JianFangDigitaldesignBehavioralsimulation………………..Simulation/timingverificationwithestimatedback-annotationPlaceandroute(placeandrouterules)DesignRuleCheck,DRC(DRCrules)Loadingextraction(rulesandparameters)Simulation/timingverificationwithrealback-annotationDesignexport………..8/6/202473JianFangPlaceandRouteGeneratesfinalchipfromgatelevelnetlistGoals: Minimumchipsize
Maximumchipspeed.Placement:PlacingallgatestominimizedistancebetweenconnectedgatesFloorplanningtoolusingdesignhierarchySpecializedalgorithms(mincut,simulatedannealing,etc.)TimingdrivenManualinterventionVerycomputeintensiveHierarchybasedfloorplanningSimulatedannealingHightemperature:movegatesrandomlyLowtemperature:MovegateslocallyMincutKeepcuttingdesigninto
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