IC測試原理解析

第一章數(shù)字集成電路測試原理前言器件測試的主要目的是保證器件在惡劣的環(huán)境條件下能完全實現(xiàn)設(shè)計規(guī)格書所規(guī)定的功能及性能指標(biāo)。用來完成這一功能的自動測試設(shè)備是由計算機(jī)控制的。因此，測試工程師必須對計算機(jī)科學(xué)編程和操作系統(tǒng)有詳細(xì)的認(rèn)識。測試工程師必須清楚了解測試設(shè)備與器件之間的接口，懂得怎樣模擬器件將來的電操作環(huán)境，這樣器件被測試的條件類似于將來應(yīng)用的環(huán)境。

首先有一點(diǎn)必須明確的是，測試成本是一個很重要的因素，關(guān)鍵目的之一就是幫助降低器件的生產(chǎn)成本。甚至在優(yōu)化的條件下，測試成本有時能占到器件總體成本的40%左右。良品率和測試時間必須達(dá)到一個平衡，以取得最好的成本效率。第一節(jié)直流參數(shù)測試接觸測試（短路-開路）:這項測試保證測試接口與器件正常連接。接觸測試通過測量輸入輸出管腳上保護(hù)二極管的自然壓降來確定連接性。二級管上如果施加一個適當(dāng)?shù)恼蚱秒娏?，二級管的壓降將?.7V左右，因此接觸測試就可以由以下步驟來完成:

1.所有管腳設(shè)為0V，

2.待測管腳上施加正向偏置電流”I”，

3.測量由”I”引起的電壓，

4.如果該電壓小于0.1V，說明管腳短路，

5.如果電壓大于1.0V，說明該管腳開路，

6.如果電壓在0.1V和1.0V之間，說明該管腳正常連接接觸測試圖解

第二節(jié)漏電參數(shù)測試IIL是指當(dāng)輸入管腳置為邏輯0時的流過的電流大小，IIH是指當(dāng)輸入管腳置為邏輯1時流過電流的大小。

IIL實際測的是輸入管腳到VDD之間的電阻，IIH實際測的是輸入管腳到GND之間的電阻

IIL測試方法:1.VDDMAX2.所有輸入管腳預(yù)置邏輯1（VIH）3.通過PMU偏置每個管腳為邏輯0（管腳與PE卡上的driver斷開），通過PMU得到實際電流的大小。IIH測試方法:1.VDDMAX2.所有輸入管腳預(yù)置邏輯0（VIL）3.通過PMU偏置每個管腳為邏輯1（管腳與PE卡上的driver斷開），通過PMU得到實際電流的大小。IIL參數(shù)測試圖解

IIH參數(shù)測試圖解

第三節(jié)電源消耗參數(shù)測試（ICC,IDD）COMS器件的電源消耗稱為IDD，TTL器件的電源消耗稱為ICC。該項測試決定器件的電源消耗規(guī)格，也就是電源管腳在規(guī)定的電壓條件下的最大電流消耗。電源消耗測試可分為靜態(tài)電源消耗測試和動態(tài)電源消耗測試。靜態(tài)電源消耗測試決定器件在空閑狀態(tài)下時最大的電源消耗，而動態(tài)電源消耗測試決定器件工作時的最大電源消耗。靜態(tài)測試方法:1.一般使用DPS（有的機(jī)器可以使用PMU）偏置VDDMAX。2.通過PATTERN使IC預(yù)置初始（空閑）狀態(tài)。2.等待1-5msec，再通過DPS量測得到的電流。3.與設(shè)計規(guī)格比較得出P/F的結(jié)果IDD/ICC參數(shù)測試圖解

IDD/ICC參數(shù)測試圖解

第四節(jié)輸出驅(qū)動電流（VOL,VOH,IOL,IOH）輸出驅(qū)動電流(VOL,VOH,IOL,IOH)。輸出驅(qū)動電流測試保證器件能在一定的電流負(fù)載下保持預(yù)定的輸出電平。VOL和VOH規(guī)格用來保證器件在器件允許的噪聲條件下所能驅(qū)動的多個器件輸入管腳的能力。

DC/ParametricTestsContinuityTest

Purpose

Toensurethereisproperandcorrectconnectionfromdevicelead/balltointernalcircuitsToensurethereisproperandcorrecthardwaresetupconditionpriortoactualdevicetestingContinuityTest

1)SetVDDto0V2)Source/sinkcurrent,normally100μAto500μAwithclampvoltage.DependsonESDdiodedesign.3)Measurevoltageoutput,supposetobeforward-biaseddiodevoltagedrop,around+/-0.7VLeakageTests

INPUTLEAKAGETESTToensurehighimpedanceisobservedbythestimulusfunctionalsignalsattheinputpins.LeakageTests

INPUTLEAKAGETESTTestMethod:1)PowerupDUT2)ForceallinputpinstoVDDlevel3)Measureresultantcurrent(IIH)4)ForceallinputpinstoGNDlevel5)Measureresultantcurrent(IIL)LeakageTests

OUTPUTLEAKAGETESTToensuretheBi-directionalandOutputtri-statepinswillnotcauseloadingonuser’ssystemapplicationboard.LeakageTests

OUTPUTLEAKAGETESTTestMethod:1)PowerupDUT2)Pre-conditionDUToutputpinstoHi-Zstate3)ForceVDDatPUTandmeasureresultantcurrent(IOZH)4)ForceGNDatPUTandmeasureresultantcurrent(IOZL)IDDTests

STATICIDDTESTEnsuretheDUTwillnotdrawmorecurrentthanthelimitstatedindevicespecificationwhendeviceisinstaticmode.DYNAMICIDDTESTEnsuretheDUTwillnotdrawmorecurrentthanthelimitstatedindevicespecificationwhendeviceisinoperatingmode.IDDTests

TestMethod:1)PowerupDUT2)PreconditionDUTtoeitherstaticmodeoroperatingmode3)MeasurecurrentofpowersupplyOtherDCTests

Example1:ReferenceVoltagetestInternalorExternalCircuittosupplyveryaccuratevoltageasreference.TestMethod:1)PowerupDUT2)PreconditionDUTsothatVrefcanbeaccessedfromPUT3)MeasurevoltagefromPUTOtherDCTests

Example2:PowerSupplyRejectionRatio(PSRR)Ameasurement,normallyindB,oftheratioofoutputsignalchangeduetoachangeinpowersupplyvoltages.Thisisameasureofthecircuit’sdependenceonaconstantsupplyvoltage.OtherDCTests

PSRRTestMethod:

1)supplyVDD=A(V),measureVoutA(V)2)supplyVDD=B(V),measureVoutB(V)3)calculate

FunctionalTestsFunctionalTestConcepts

WhatisDigitalFunctionalTesting?DigitalFunctionalTestingisto:1.DefineinputwaveformsperDUTrequirements;and

2.CheckoutputwaveformsagainstexpecteddataofDUTEnsureDUTwillcorrectlyperformitsintendedlogicalfunction.FunctionalTestConcepts

Allfunctionaltestsconsistoftwodistinctcomponents,1.thetestvectororpatternfile2.theinstructionscontainedwithinthemaintestprogram.ThetestvectororpatternfilerepresentstheinputandoutputlogicstatesneededtotesttheDUT.Thetestprogramcontainstheinformationneededtocontrolthetesthardwareinamannerthatwillcreateallthenecessaryvoltages,waveformsandtimings.FunctionalTestConcepts

DefiningtheOperationofaDUTwithaTruthTableFunctionalTestConcepts

FunctionalTestConcepts

InputLogic

FunctionalTestConcepts

OutputLogic

FunctionalTestConcepts

BasicTerms1)VDD/GROUND2)VIL/VIH3)IIL/IIH4)ClockCycle5)TestPattern/Vector6)DataFormat7)VOL/VOH8)IOL/IOH(load)9)TimingStrobeFunctionalTestConcepts

ACTestsACTests

BasicTerms*CODECasexample1)Bits--ThenumberofuniquecodesproducedbyADCoutputrepresentedasapowerof2.2)LSB--LeastSignificantBit,theamountofinputvoltagerequiredtochangethedigitaloutputbyonecodeonanidealADC.3)MSB--MostSignificantBit,thisisthedigitaloutputbitthatcarriesthemostweight.4)Decibels--adimensionlessunitofmeasurementofpowerratio.ACTests

Example1:ACStaticParametersofADC/DAC– FullScaleRange(FSR)– OffsetError– GainError–DifferentialNon-Linearity(DNL)–Monotonic– IntegralNon-Linearity(INL)ACTests--DAC

ACTests--ADC

ACTests

TestMethodofDACStaticACParametersACTests

TestMethodofDACStaticACParameters

ACTests

ACDynamicParametersofADC/DACACTests

SamplingSamplingistoconvertacontinuoustimesignaltodigitalsignals.Shannon’sTheoremSample_Frequency(Fs)=2xSignal_FrequencyNyquist’sTheoremSample_Frequency(Fs)>2xSignal_FrequencyACTests

SamplingThemoresampleperperiod,themoreinformationthatcanbegleanedfromsampleset.Nyquist’sFrequencyisadvantageous.ACTests

Complexnumbersprovideawaytomathematicallydescribeanamplitude/frequencywaveform.ACTests

FourierSeriesItallowsvirtuallyanyrealworldsignaltobedecomposedintoacollectionofsinewaves.ACTests

TimeDomainV.S.FrequencyDomainIdealSineWaveACTests

TimetofrequencyTransformACTests

SineWaveInTimeDomain&FrequencyDomainACTests

DigitalSignalProcessor(orArrayProcessor)DSPfu