WATERS公司的UPLC-TQD培訓(xùn)資料 MS6調(diào)諧頁面

調(diào)諧頁面TQD調(diào)諧頁面設(shè)定離子模式Ionmodeisset設(shè)定儀器參數(shù)Instrumentparametersareset.API和碰撞氣〔Collisiongases〕已經(jīng)調(diào)節(jié)完畢.先導(dǎo)化合物〔Parentcompounds〕已經(jīng)確定并優(yōu)化子離子〔Daughterions〕已經(jīng)決定并優(yōu)化設(shè)置Mass分辨率〔Resolution〕碰撞能量〔CollisionEnergies〕已優(yōu)化執(zhí)行采集2儀器調(diào)諧頁面(MSTune)使用儀器快捷菜單〔InstrumentShortcutItem〕AccessingtheTQDTunePage3TQD儀器調(diào)諧頁面4保存調(diào)諧頁面參數(shù)UsetheNew,Open,SaveorPrinttoolsorusetheFilemenufortheseoperations.5離子模式IonMode6氮氣與碰撞氣NitrogenGasandCollisionGas7OperateStandbyTunePage–源的控制界面

8設(shè)置毛細(xì)管〔Capillary〕和錐孔〔Cone〕電壓9設(shè)置萃取錐孔〔Extractor〕電壓和RF透鏡〔RFLens〕電壓10設(shè)置源〔Source〕以及去溶劑〔Desolvation〕溫度11氮氣流速12調(diào)諧頁面–質(zhì)量分析器(Analyzer)13常用的質(zhì)量分析器參數(shù)設(shè)置-MSScan

14常用的質(zhì)量分析器參數(shù)設(shè)置–SIR15常用的質(zhì)量分析器參數(shù)設(shè)置-DaughterScan16常用的質(zhì)量分析器參數(shù)設(shè)置–MRM17常用的質(zhì)量分析器參數(shù)設(shè)置-ParentScan18典型的質(zhì)量分析器參數(shù)設(shè)置–ConstantNeutralLoss19PurgeRefillSyringeStart/Stop流路〔Fluidics〕控制20正常的流路21InfusionDispense22InfusionRefill23CombinedInfusion24CombinedRefill25廢液流路WasteFlow26儀器調(diào)諧頁面上的峰顯示27顯示質(zhì)量數(shù)(Da)的范圍或者寬度顯示的中心質(zhì)量數(shù)顯示的信號增益MSScan等功能的顯示峰顯示設(shè)置28在底部或者頂部的工具欄雙擊鼠標(biāo)，可以增加或者減少增益的設(shè)置點擊X一下，可以恢復(fù)前面的范圍和增益設(shè)置，再點擊一下可以回到缺省的設(shè)置。峰顯示設(shè)置29可以同時顯示多個質(zhì)譜峰點擊選擇是否顯示30功能Function顯示31Set=Parent/precursorIonSet是母離子/先導(dǎo)離子峰顯示的設(shè)置32范圍參數(shù)〔ScopeParameters〕33真空〔Vacuum〕狀態(tài)34從調(diào)諧頁面采集質(zhì)譜圖35從調(diào)諧頁面采集質(zhì)譜圖36多離子模式-ESCi37ESCi調(diào)諧頁面38Inter-Scan設(shè)置39系統(tǒng)管理40診斷41查看儀器閾值參數(shù)〔InstrumentThresholdParameters〕4216datapoints/amu8datapoints/amu4datapoints/amu100101102103104100%94%97%BestResolutionSmoothAppearanceCompromisem/zMM+1ProfileData–

數(shù)據(jù)點的格式4316DataPoints/DaltonNoSmoothing8DataPoints/DaltonNoSmoothing4DataPoints/DaltonNoSmoothingProstaglandinPGF2a-ESInegative

AcquisitionMode: ContinuumMassrange: 100-500amuScanSpeed: 400amu/s數(shù)據(jù)點/Da的數(shù)量對表觀分辨率的影響44BASELINELEVEL=00Intensitym/z

BASELINELEVEL=10IntensityBASELINELEVEL=50IntensityIonCurrentXIonCurrentZ>IonCurrentYIonCurrentY>IonCurrentX

BaselineLeveltypicallysetto0ProfileData–基線水平〔BaselineLevel〕45CentroidData46單一離子記錄〔SingleIonRecording，SIR〕:基線水平〔BaselineLevel〕的影響47Setto0(IonCounting

ThresholdDisabled)Setto2(2timetheRSDofnoise

observedwithoutionbeam)Setto4(4timestheRSDof

noiseobservedwithoutionbeam)Setto10(10timestheRSDof

noiseobservedwithoutionbeam)HigherIntensityLowerIntensityBestAdjustmentIonCounting